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Optimized junction temperature fluctuation suppression technique for SiC MOSFETs in a wireless charging system
Ruoyin Wang Xueliang Huang Jiacheng Li
Vol. 22, No. 5, pp. 859-869, May 2022
10.1007/s43236-022-00393-2
Vol. 22, No. 5, pp. 859-869, May 2022
10.1007/s43236-022-00393-2
ISSN : 1598 - 2092
eISSN : 2093 - 4718